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An approach to compute EDC and DYD for test-day models
Author(s) -
Helge Täubert,
Z. Liu,
J. Tarrés,
Vincent Ducrocq
Publication year - 2010
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - computer science , test (biology) , reliability engineering , geology , engineering , paleontology

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