An atomistic insight into interface formation in directly integrated materials: a modeling study of CuO deposition on Al(111) through DFT-kMC approach | Zendy

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An atomistic insight into interface formation in directly integrated materials: a modeling study of CuO deposition on Al(111) through DFT-kMC approach

Author(s) -

Mathilde Guiltat,

Anne Hémeryck

Publication year - 2016

Publication title -

hal (le centre pour la communication scientifique directe)

Language(s) - English

Resource type - Conference proceedings

Subject(s) - deposition (geology) , materials science , interface (matter) , chemical physics , nanotechnology , optoelectronics , computer science , engineering physics , chemistry , physics , composite material , geology , paleontology , sediment , capillary number , capillary action

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