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Robustesse de MESFET SiC face aux décharges électrostatiques
Author(s) -
Tanguy Phulpin,
D. Trémouilles,
Karine Isoird,
Patrick Austin,
M. Vellvehı́,
Xavier Perpinyà,
X. Jordà,
Javier León
Publication year - 2016
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - French
Resource type - Conference proceedings
Subject(s) - humanities , physics , philosophy

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