Open AccessThermal Runaway Robustness of SiC VJFETs
Author(s) -
Rémy Ouaida,
Cyril Buttay,
Anh Dung Hoang,
Raphaël Riva,
Dominique Bergogne,
Hervé Morel,
Christophe Raynaud,
Florent Morel
Publication year - 2012
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - Uncategorized
Resource type - Conference proceedings
Subject(s) - thermal runaway , robustness (evolution) , materials science , thermal , computer science , physics , meteorology , thermodynamics , power (physics) , biochemistry , chemistry , battery (electricity) , gene
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