Open AccessLow frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
Author(s) -
Bogdan Cretu,
Eddy Simoen,
Jean-Marc Routoure,
Régis Carin,
Marc Aoulaiche,
Cor Claeys
Publication year - 2013
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - characterization (materials science) , materials science , optoelectronics , noise (video) , channel (broadcasting) , electronic engineering , computer science , nanotechnology , telecommunications , engineering , artificial intelligence , image (mathematics)
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