Open AccessA New Technique to Extract the Gate Bias Dependent S/D Series Resistance of Sub-100nm MOSFETs
Author(s) -
Fleury, D.,
Cros, A.,
G. Bidal,
Brut, H.,
Josse, E.,
Ghibaudo, G.
Publication year - 2009
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - equivalent series resistance , series (stratigraphy) , mosfet , electronic engineering , logic gate , electrical engineering , materials science , optoelectronics , computer science , engineering , transistor , voltage , paleontology , biology
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