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Pixel-wise full-field strain measurements for analysis of strain heterogeneities with regards to the material microstructure
Author(s) -
Adrien Berger,
Jean-François Witz,
Ahmed El Bartali,
Nathalie Limodin,
Mirentxu Dubar,
Denis Najjar
Publication year - 2020
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - microstructure , strain (injury) , pixel , speckle pattern , materials science , image resolution , magnification , field (mathematics) , resolution (logic) , optical flow , optical microscope , optics , composite material , computer science , computer vision , artificial intelligence , image (mathematics) , physics , mathematics , scanning electron microscope , medicine , pure mathematics

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