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Quantification of the Effect of Surface Slope on Mechanical Measurements by Contact-Resonance AFM
Author(s) -
Karsta Heinze,
Olivier Arnould,
JeanYves Delenne,
Valérie LullienPellerin,
Michel Ramonda,
Matthieu George
Publication year - 2017
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - atomic force microscopy , resonance (particle physics) , materials science , surface (topology) , nanotechnology , physics , geometry , atomic physics , mathematics

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