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AN AUTOMATED MEASUREMENT BENCH FOR INTEGRATED BAW RESONATORS NONLINEAR CHARACTERIZATION AT MICROWAVE FREQUENCIES
Author(s) -
Sylvain Godet,
Sébastien Gribaldo,
E. Tournier,
Olivier Llopis,
Alexandre Reinhardt,
Jean-Baptiste David
Publication year - 2008
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - resonator , analyser , microwave , nonlinear system , test bench , amplifier , acoustics , characterization (materials science) , electronic engineering , network analyzer (electrical) , power (physics) , harmonic analysis , harmonic , materials science , computer science , physics , optoelectronics , electrical engineering , engineering , optics , telecommunications , quantum mechanics , cmos

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