z-logo
open-access-imgOpen Access
Discrete Event Model-Based Approach for Fault Detection and Isolation of Manufacturing Systems
Author(s) -
Alexandre Philippot,
Moamar Sayed-Mouchaweh,
Véronique Carré-Ménétrier
Publication year - 2009
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - fault detection and isolation , isolation (microbiology) , computer science , event (particle physics) , discrete event simulation , fault (geology) , reliability engineering , real time computing , engineering , artificial intelligence , simulation , geology , seismology , physics , quantum mechanics , microbiology and biotechnology , actuator , biology

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom