Open AccessWorst-Case and Average-Case Analysis of n-Detection Test Sets
Author(s) -
Irith Pomeranz,
Sudhakar M. Reddy
Publication year - 2005
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - set (abstract data type) , fault detection and isolation , test set , test (biology) , fault coverage , algorithm , computer science , fault (geology) , automatic test pattern generation , mathematics , statistics , data mining , artificial intelligence , engineering , electronic circuit , paleontology , electrical engineering , seismology , geology , actuator , biology , programming language