Open AccessReliability and costs of GMO detection
Author(s) -
Theo R. Allnutt,
Mira Ayadi,
Stefan Baeumler,
Gilbert Berben,
Knut G Berdal,
Charlotte Boydler Andersen,
Yves Bertheau,
Peter Brodmann,
Meti Buh Gašparič,
Katarina Cankar,
Frédéric Debode,
Teresa Esteve,
Arne HolstJensen,
E. J. Jensen,
Andre Kobilinsky,
Jose La Paz,
David Lee,
Valérie Laval,
María Pla,
Torstein Tengs,
Doerte Wulf,
David Zhang,
Jana Žel,
Kristina Gruden
Publication year - 2009
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , risk analysis (engineering) , engineering , business , power (physics) , physics , quantum mechanics