Open AccessA DEVS-based Modeling Behavioral Fault Simulator for RT-Level Digital Circuits
Author(s) -
Laurent Capocchi,
Fabrice Bernardi,
Dominique Fédérici,
Paul-Antoine Bisgambiglia
Publication year - 2004
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - devs , correctness , fault simulator , computer science , vhdl , automatic test pattern generation , behavioral modeling , digital electronics , logic simulation , electronic circuit simulation , fault model , formalism (music) , hardware description language , fault injection , discrete event simulation , fault coverage , fault (geology) , simulation , stuck at fault , electronic circuit , embedded system , modeling and simulation , algorithm , fault detection and isolation , software , logic gate , engineering , programming language , field programmable gate array , artificial intelligence , actuator , seismology , electrical engineering , geology , art , visual arts , musical