Open AccessA new Methodology for Multi-Level Thermal Characterization of Complex Electronic Systems: From Die to Board Level
Author(s) -
O. Martins,
Nicolas Peltier,
S. Guedon,
Sylvian Kaiser,
Yves Maréchal,
Yvan Avenas
Publication year - 2009
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - die (integrated circuit) , characterization (materials science) , computer science , materials science , nanotechnology , operating system