z-logo
open-access-imgOpen Access
Techniques and Prospects for Fault-tolerance in Post-CMOS ULSI
Author(s) -
Yangyang Tang,
Gopalakrishnan Sundararajan,
Chris Winstead,
Emmanuel Boutillon,
Christophe Jégo,
Michel Jézéquel
Publication year - 2012
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - redundancy (engineering) , triple modular redundancy , computer science , fault tolerance , cmos , modular design , logic gate , masking (illustration) , transient (computer programming) , electronic engineering , algorithm , engineering , distributed computing , operating system , art , visual arts

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom