Open AccessLocalization of single gate design errors in combinational circuits by diagnostic information about stuck-at faults
Author(s) -
Raimund Ubar,
D. Borrione
Publication year - 1998
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - combinational logic , computer science , logic gate , fault (geology) , electronic circuit , algorithm , error detection and correction , translation (biology) , computer engineering , engineering , seismology , electrical engineering , geology , biochemistry , chemistry , messenger rna , gene
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