Open AccessReal-cases of electromagnetic immunity and reliability in embedded electronics architectures
Author(s) -
Jean-Marc Diénot,
Emmanuel Batista
Publication year - 2012
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - reliability (semiconductor) , electronics , electromagnetic compatibility , electrical engineering , reliability engineering , computer science , engineering , electronic engineering , physics , power (physics) , quantum mechanics
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