z-logo
open-access-imgOpen Access
Effect of Electrical Stresses on the Susceptibility of a Voltage regulator
Author(s) -
Jian-Fei Wu,
Jiancheng Li,
Rongjun Shen,
Alexandre Boyer,
S. Ben Dhia
Publication year - 2013
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - dropout voltage , regulator , voltage regulator , low dropout regulator , voltage , offset (computer science) , electromagnetic interference , electronic circuit , input offset voltage , electrical engineering , electronic engineering , materials science , engineering , computer science , chemistry , operational amplifier , biochemistry , gene , amplifier , programming language , cmos

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom