Open Access3D modelling of electrostatic force distance curve between the AFM probe and dielectric surface
Author(s) -
A. Boularas,
Fulbert Baudoin,
G. Teyssèdre,
Christina Villeneuve-Faure,
Stéphane Clain
Publication year - 2014
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - electrostatic force microscope , cantilever , conical surface , dielectric , electrostatics , atomic force microscopy , materials science , non contact atomic force microscopy , conductive atomic force microscopy , kelvin probe force microscope , surface charge , surface (topology) , nanotechnology , optoelectronics , physics , geometry , composite material , quantum mechanics , mathematics
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