Open AccessTEST LEVEL FOR AN EXPERIMENTAL RELIABILITY DEMONSTRATION
Author(s) -
A Banvillet,
Pascal Lelan,
B. Colin
Publication year - 2018
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - reliability engineering , reliability (semiconductor) , test (biology) , computer science , engineering , paleontology , power (physics) , physics , quantum mechanics , biology