Open AccessLow frequency noise assessment in advanced UTBOX SOI n-channel MOSFETs
Author(s) -
V. Strobel,
B. Cretu,
S. D. dos Santos,
Eddy Simoen,
JeanMarc Routoure,
R. Carin,
M. Aoulaiche,
M. Jurczak,
J. A. Martino,
Cor Claeys
Publication year - 2013
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - silicon on insulator , noise (video) , infrasound , materials science , transistor , optoelectronics , flicker noise , silicon , mosfet , phase noise , noise measurement , spectral line , electrical engineering , physics , noise figure , acoustics , noise reduction , cmos , engineering , computer science , voltage , artificial intelligence , image (mathematics) , amplifier , astronomy
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