Open AccessDetection of bias in measurement using analytical redundancy
Author(s) -
Frédéric Kratz,
José Ragot,
Didier Maquin,
Antoine Despujols
Publication year - 1990
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - redundancy (engineering) , computer science , nonlinear system , data mining , reliability (semiconductor) , reliability engineering , engineering , operating system , power (physics) , physics , quantum mechanics