Open AccessMetrology of Tomography for Engineering
Author(s) -
M Wang
Publication year - 2017
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - tomography , metrology , multiphase flow , opacity , electrical capacitance tomography , industrial computed tomography , process (computing) , electrical resistance and conductance , optical tomography , computer science , electrical resistivity tomography , mechanical engineering , process engineering , engineering , electrical resistivity and conductivity , physics , electrical engineering , optics , mechanics , electrode , quantum mechanics , capacitance , operating system