Open AccessNew method for grain size characterization of a multi-crystalline silicon ingot
Author(s) -
Maxime Forster,
Erwann Fourmond,
JeanMarie Lebrun,
Roland Einhaus,
J. Kraiem,
M. Lemiti
Publication year - 2009
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - ingot , materials science , wafer , silicon , equiaxed crystals , grain size , crystalline silicon , metallurgy , crystallization , characterization (materials science) , solar cell , optoelectronics , microstructure , nanotechnology , alloy , chemistry , organic chemistry