Open AccessAccuracy and reliability of different models used for the prediction of the migration from monolayer and multilayer materials
Author(s) -
Olivier Vitrac,
Daniel Goujot
Publication year - 2008
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - reliability (semiconductor) , probabilistic logic , computer science , software , identification (biology) , work (physics) , reliability engineering , software quality , data mining , software development , artificial intelligence , engineering , programming language , physics , mechanical engineering , power (physics) , quantum mechanics , botany , biology
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