Open AccessAccuracy and reliability of different models used for the prediction of the migration from monolayer and multilayer materials
Author(s) -
Olivier Vitrac,
Daniel Goujot
Publication year - 2008
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - reliability (semiconductor) , computer science , monolayer , reliability engineering , materials science , engineering , nanotechnology , physics , power (physics) , quantum mechanics