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Sensitivity of different methods for simultaneous evaluation of emissivity and temperature through multispectral infrared thermography simulation
Author(s) -
Thibaud Toullier,
Jean Dumoulin,
Laurent Mevel
Publication year - 2019
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - emissivity , thermography , multispectral image , sensitivity (control systems) , infrared , remote sensing , materials science , environmental science , low emissivity , computer science , optics , geology , engineering , electronic engineering , physics

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