Conditional Variables Double Sampling Plan for Weibull Distributed Lifetimes under Sudden Death Testing
Author(s) -
S. Balamurali
Publication year - 2012
Publication title -
bonfring international journal of data mining
Language(s) - English
Resource type - Journals
eISSN - 2277-5048
pISSN - 2250-107X
DOI - 10.9756/bijdm.1343
Subject(s) - weibull distribution , reliability (semiconductor) , selection (genetic algorithm) , sampling (signal processing) , limiting , statistics , mathematics , plan (archaeology) , mathematical optimization , reliability engineering , computer science , engineering , power (physics) , machine learning , mechanical engineering , physics , archaeology , filter (signal processing) , quantum mechanics , computer vision , history
In this paper, we propose a conditional sampling plan called conditional double sampling plan for lot acceptance of parts whose life time follows a Weibull distribution with known shape parameter under sudden death testing. A table is also developed for the selection and application of optimal parameters of the proposed plan for specified two points on the operating characteristic curve namely the acceptable reliability level and the limiting reliability level along with the producer and consumer's risks. The optimization problem is formulated as a nonlinear programming where the objective function to be minimized is the average group number and the constraints are related to lot acceptance probabilities at acceptable reliability level and limiting reliability level under the operating characteristic curve
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