Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method | Zendy

ByeongSeon An | Zendy; Yeon Ju Shin | Zendy; Jae-Seon Ju | Zendy; CheolWoong Yang | Zendy

Open Access

Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method

Author(s) -

ByeongSeon An,

Yeon Ju Shin,

Jae-Seon Ju,

CheolWoong Yang

Publication year - 2018

Publication title -

han-guk hyeonmigyeong hakoeji/applied microscopy

Language(s) - English

Resource type - Journals

eISSN - 2287-4445

pISSN - 2234-6198

DOI - 10.9729/am.2018.48.4.122

Subject(s) - transmission electron microscopy , electron beam induced deposition , focused ion beam , materials science , layer (electronics) , ion beam , cathode ray , electron microscope , deposition (geology) , energy filtered transmission electron microscopy , electron tomography , beam (structure) , transmission (telecommunications) , ion , electron , optoelectronics , nanotechnology , optics , scanning transmission electron microscopy , chemistry , physics , electrical engineering , engineering , paleontology , organic chemistry , quantum mechanics , sediment , biology

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