Open AccessToward High-Resolution Cryo-Electron Microscopy: Technical Review on Microcrystal-Electron Diffraction
Author(s) -
Sangmin Lee,
Jeong Min Chung,
Hyun Suk Jung
Publication year - 2017
Publication title -
han-guk hyeonmigyeong hakoeji/applied microscopy
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2287-4445
pISSN - 2234-6198
DOI - 10.9729/am.2017.47.4.223
Subject(s) - electron microscope , electron , resolution (logic) , materials science , cryo electron microscopy , electron diffraction , reflection high energy electron diffraction , diffraction , microscopy , optics , computer science , physics , nuclear magnetic resonance , artificial intelligence , nuclear physics
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