z-logo
open-access-imgOpen Access
Cross-Sectional Transmission Electron Microscopy Sample Preparation of Soldering Joint Using Ultramicrotomy
Author(s) -
JeeHwan Bae,
Yena Kwon,
CheolWoong Yang
Publication year - 2016
Publication title -
han-guk hyeonmigyeong hakoeji/applied microscopy
Language(s) - English
Resource type - Journals
eISSN - 2287-4445
pISSN - 2234-6198
DOI - 10.9729/am.2016.46.3.167
Subject(s) - soldering , materials science , transmission electron microscopy , joint (building) , sample preparation , composite material , diamond , metallurgy , nanotechnology , chemistry , structural engineering , chromatography , engineering

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom