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A Brief Comment on Atom Probe Tomography Applications
Author(s) -
Jae Bok Seol,
YoungTae Kim,
ChanGyung Park
Publication year - 2016
Publication title -
han-guk hyeonmigyeong hakoeji/applied microscopy
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2287-4445
pISSN - 2234-6198
DOI - 10.9729/am.2016.46.3.127
Subject(s) - atom probe , tomography , materials science , computer science , nanotechnology , physics , optics , transmission electron microscopy

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