Open AccessCross-Sectional Transmission Electron Microscopy Specimen Preparation Technique by Backside Ar Ion Milling
Author(s) -
Jung Ho Yoo,
JunMo Yang
Publication year - 2015
Publication title -
han-guk hyeonmigyeong hakoeji/applied microscopy
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2287-4445
pISSN - 2234-6198
DOI - 10.9729/am.2015.45.4.189
Subject(s) - transmission electron microscopy , materials science , ion milling machine , ion , electron microscope , composite material , metallurgy , nanotechnology , chemistry , optics , physics , organic chemistry , layer (electronics)
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom