Three-Dimensional Automated Crystal Orientation and Phase Mapping Analysis of Epitaxially Grown Thin Film Interfaces by Using Transmission Electron Microscopy | Zendy

ChangYeon Kim | Zendy; Jihyun Lee | Zendy; Seung Jo Yoo | Zendy; SeokHoon Lee | Zendy; Jin-Gyu Kim | Zendy

Open Access

Three-Dimensional Automated Crystal Orientation and Phase Mapping Analysis of Epitaxially Grown Thin Film Interfaces by Using Transmission Electron Microscopy

Author(s) -

ChangYeon Kim,

Jihyun Lee,

Seung Jo Yoo,

SeokHoon Lee,

Jin-Gyu Kim

Publication year - 2015

Publication title -

han-guk hyeonmigyeong hakoeji/applied microscopy

Language(s) - English

Resource type - Journals

eISSN - 2287-4445

pISSN - 2234-6198

DOI - 10.9729/am.2015.45.3.183

Subject(s) - electron backscatter diffraction , materials science , epitaxy , transmission electron microscopy , high resolution transmission electron microscopy , crystal (programming language) , electron diffraction , scanning transmission electron microscopy , crystallography , optoelectronics , layer (electronics) , optics , diffraction , nanotechnology , microstructure , chemistry , composite material , computer science , physics , programming language

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