Open AccessCharacterization of Two-Dimensional Transition Metal Dichalcogenides in the Scanning Electron Microscope Using Energy Dispersive X-ray Spectrometry, Electron Backscatter Diffraction, and Atomic Force Microscopy
Author(s) -
Christian Lång,
Matthew Hiscock,
Kim Larsen,
Jonathan Moffat,
Ravi S. Sundaram
Publication year - 2015
Publication title -
han-guk hyeonmigyeong hakoeji/applied microscopy
Language(s) - English
Resource type - Journals
eISSN - 2287-4445
pISSN - 2234-6198
DOI - 10.9729/am.2015.45.3.131
Subject(s) - characterization (materials science) , electron backscatter diffraction , materials science , scanning electron microscope , nanotechnology , semiconductor , diffraction , silicon , reflection high energy electron diffraction , optoelectronics , optics , electron diffraction , physics , composite material
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