Effective post-silicon failure localization using dynamic program slicing | Zendy

Ophir Friedler | Zendy; Wisam Kadry | Zendy; Arkadiy Morgenshtein | Zendy; Amir Nahir | Zendy; Vitali Sokhin | Zendy

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Effective post-silicon failure localization using dynamic program slicing

Author(s) -

Ophir Friedler,

Wisam Kadry,

Arkadiy Morgenshtein,

Amir Nahir,

Vitali Sokhin

Publication year - 2014

Publication title -

design, automation andamp; test in europe conference andamp; exhibition (date), 2015

Language(s) - Uncategorized

Resource type - Conference proceedings

DOI - 10.7873/date2014.332

Subject(s) - program slicing , observability , computer science , slicing , dependency graph , set (abstract data type) , dependency (uml) , task (project management) , software bug , process (computing) , instruction set , test case , software , worst case execution time , reliability engineering , resource (disambiguation) , test set , state (computer science) , embedded system , software engineering , programming language , execution time , artificial intelligence , machine learning , computer network , regression analysis , mathematics , management , world wide web , engineering , economics

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