Open AccessA High Resolution X-ray Diffraction and TEM Study of the CuxSe Surface Phase of Cu-rich CuInSe2
Author(s) -
Paul Fons,
Shigeru Niki,
Manabu Uchino,
Akimasa Yamada,
Hiroyuki Oyangi
Publication year - 2000
Publication title -
japanese journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 129
eISSN - 1347-4065
pISSN - 0021-4922
DOI - 10.7567/jjaps.39s1.189
Subject(s) - molecular beam epitaxy , epitaxy , crystallite , transmission electron microscopy , electron diffraction , diffraction , crystallography , x ray crystallography , phase (matter) , stoichiometry , analytical chemistry (journal) , materials science , chemistry , optics , nanotechnology , chromatography , physics , organic chemistry , layer (electronics)
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