Open AccessElectron Yield XAFS Study of Evaporated Co/Pd Multilayers with Various Thickness Ratios of Co to Pd Sublayers: Simulations of the Co K-edge XAFS and Fourier Transforms
Author(s) -
M. Choi,
J. H. Joo,
S. K. Kim,
J.-S. Kang,
Y.-P. Lee,
S.-C. Shin,
S. M. Heald
Publication year - 1993
Publication title -
japanese journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 129
eISSN - 1347-4065
pISSN - 0021-4922
DOI - 10.7567/jjaps.32s2.410
Subject(s) - x ray absorption fine structure , materials science , fourier transform , analytical chemistry (journal) , yield (engineering) , palladium , fourier transform infrared spectroscopy , chemistry , optics , spectroscopy , physics , metallurgy , catalysis , chromatography , biochemistry , quantum mechanics
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