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Correlations between Transport Properties and Valence Band Spectra of Thin Films of Nb1-xSix
Author(s) -
K. Söldner,
G. SaemannIschenko
Publication year - 1987
Publication title -
japanese journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 129
eISSN - 1347-4065
pISSN - 0021-4922
DOI - 10.7567/jjaps.26s3.807
Subject(s) - x ray photoelectron spectroscopy , thin film , electrical resistivity and conductivity , spectral line , materials science , diffraction , valence (chemistry) , valence band , analytical chemistry (journal) , sputter deposition , cavity magnetron , electronic band structure , cathode , crystallography , sputtering , condensed matter physics , chemistry , band gap , nuclear magnetic resonance , optics , physics , nanotechnology , optoelectronics , organic chemistry , quantum mechanics , astronomy , chromatography

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