Open AccessElectron Beam Testing of Josephson Junction Voltages
Author(s) -
H. Sadorf,
W. Jutzi
Publication year - 1987
Publication title -
japanese journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 129
eISSN - 1347-4065
pISSN - 0021-4922
DOI - 10.7567/jjaps.26s3.1587
Subject(s) - liquid helium , analyser , materials science , cathode ray , voltage , scanning electron microscope , josephson effect , low voltage electron microscope , condensation , acceleration voltage , cryopump , electron beam induced deposition , range (aeronautics) , pi josephson junction , electron , electron microscope , optoelectronics , atomic physics , helium , condensed matter physics , optics , superconductivity , physics , scanning transmission electron microscopy , composite material , quantum mechanics , thermodynamics
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