The Residual Gas Ionization Profile Monitor in the J-PARC 3-GeV Rapid Cycling Synchrotron | Zendy

Hiroyuki Harada | Zendy; Shinichi Kato | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

The Residual Gas Ionization Profile Monitor in the J-PARC 3-GeV Rapid Cycling Synchrotron

Author(s) -

Hiroyuki Harada,

Shinichi Kato

Publication year - 2015

Publication title -

proceedings of the 2nd international symposium on science at j-parc — unlocking the mysteries of life, matter and the universe —

Language(s) - English

Resource type - Conference proceedings

DOI - 10.7566/jpscp.8.012011

Subject(s) - rapid cycling , j parc , synchrotron , ionization , cycling , nuclear physics , residual , materials science , nuclear engineering , physics , computer science , ion , optics , engineering , beam (structure) , quantum mechanics , bipolar disorder , history , cognition , archaeology , algorithm , neuroscience , biology

The residual gas Ionization Profile Monitor (IPM) is developed in the J-PARC 3-GeV RCS. The IPM is a non-destructive beam profile monitor to observe a circulating transverse beam profile in the ring. It is very important to observe the beam profile turn-by-turn in the ring for identification of the beam loss and emittance growth source because beam loss is always issue in increasing the beam power in terms of keeping hands on maintenance. The IPM has been continuously upgraded since 2008. The recent progress of the IPM is reported together with the outline of IPM system.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research