Open AccessMetal Artifact Reduction by Energy-Resolved CT Using Two-Dimensional “transXend” Detector
Author(s) -
Kentaro Ouchi,
Ikuo Kanno
Publication year - 2019
Language(s) - Uncategorized
Resource type - Conference proceedings
DOI - 10.7566/jpscp.24.011027
Subject(s) - artifact (error) , detector , reduction (mathematics) , energy (signal processing) , materials science , metal , computer science , computer vision , metallurgy , statistics , telecommunications , mathematics , geometry
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