Beam Diagnostics for Low Energy Antiprotons

This paper presents a comprehensive set of beam diagnostics that has been developed to characterize low energy antiproton and ion beams (during initial machine commissioning) and subsequent facility operation. It shows results from simulations and experiments using invasive and non-invasive monitors for absolute beam current measurements; capacitive pickups for position detection; scintillating screens, secondary emission monitors and micro channel plate detectors for transverse profile monitoring, as well as an ultra-cold gas jet for minimally-invasive profile measurements and in-ring experiments. The identified limits are discussed for each technique, and options for further improvements are indicated.