Open AccessTest plan for validating a Context Driven Integrated Model (CDIM) for sheet metal die design
Author(s) -
Kevin K Jurrens
Publication year - 1991
Language(s) - English
Resource type - Reports
DOI - 10.6028/nist.ir.4699
Subject(s) - context (archaeology) , plan (archaeology) , test plan , die (integrated circuit) , sheet metal , test (biology) , computer science , engineering , geology , mechanical engineering , mathematics , statistics , paleontology , weibull distribution
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