Comparative high voltage impulse measurement
Author(s) -
Gerald J. FitzPatrick,
E. F. Kelley
Publication year - 1996
Publication title -
journal of research of the national institute of standards and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.202
H-Index - 59
eISSN - 2165-7254
pISSN - 1044-677X
DOI - 10.6028/jres.101.063
Subject(s) - voltage divider , nist , voltage , resistive touchscreen , impulse (physics) , high voltage , electrical engineering , computer science , physics , engineering , quantum mechanics , natural language processing
A facility has been developed for the determination of the ratio of pulse high voltage dividers over the range from 10 kV to 300 kV using comparative techniques with Kerr electro-optic voltage measurement systems and reference resistive voltage dividers. Pulse voltage ratios of test dividers can be determined with relative expanded uncertainties of 0.4 % (coverage factor k = 2 and thus a two standard deviation estimate) or less using the complementary resistive divider/Kerr cell reference systems. This paper describes the facility and specialized procedures used at NIST for the determination of test voltage divider ratios through comparative techniques. The error sources and special considerations in the construction and use of reference voltage dividers to minimize errors are discussed, and estimates of the measurement uncertainties are presented.
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