Open AccessOptical and Other Measurement Techniques of Carrier Lifetime in Semiconductors
Author(s) -
Yeasir Arafat,
Farseem Mannan Mohammedy,
Muhammad Hassan
Publication year - 2012
Publication title -
international journal of optoelectronic engineering
Language(s) - English
Resource type - Journals
eISSN - 2167-731X
pISSN - 2167-7301
DOI - 10.5923/j.ijoe.20120202.02
Subject(s) - carrier lifetime , auger effect , charge carrier , semiconductor , recombination , carrier generation and recombination , free carrier absorption , wafer , auger , materials science , laser , optoelectronics , atomic physics , chemistry , optics , silicon , physics , biochemistry , gene