Investigation of Dielectric Properties of Ni/n-TiO2/p-Si/Al Heterojunction in Wide Range of Temperature and Voltage
Author(s) -
Arun Kumar,
Vikas Kumar,
K. K. Sharma
Publication year - 2022
Publication title -
international journal of engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.225
H-Index - 17
ISSN - 1728-1431
DOI - 10.5829/ije.2022.35.04a.09
Subject(s) - materials science , dielectric , atmospheric temperature range , dielectric spectroscopy , capacitance , electrical resistivity and conductivity , composite material , analytical chemistry (journal) , optoelectronics , electrical engineering , chemistry , electrode , physics , chromatography , meteorology , electrochemistry , engineering
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