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Analysis and Design of Tri-Gate MOSFET with High Dielectrics Gate
Author(s) -
Viranjay M. Srivastava,
Setu P. Singh
Publication year - 2012
Publication title -
international journal of intelligent systems and applications
Language(s) - English
Resource type - Journals
eISSN - 2074-9058
pISSN - 2074-904X
DOI - 10.5815/ijisa.2012.05.03
Subject(s) - gate dielectric , high κ dielectric , metal gate , scaling , transistor , mosfet , dielectric , cmos , optoelectronics , computer science , materials science , very large scale integration , electrical engineering , gate oxide , electronic engineering , mathematics , engineering , voltage , embedded system , geometry
The scaling of simple gate transistors requires the scaling and transistor elements like source/drain junction became difficult to scale further after a limit due to adverse effect of electrostatic and short-channel performance. The solution of the problem is tri-gate where we can increase the performance without increasing the width and without scaling. In this paper we have described the parameter of tri-gate and taking the high dielectric as substrate. Index Terms—Tri-gate MOSFET; Radio frequency; HfO2; High dielectric constant; CMOS; VLSI.

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