Open AccessReliability of Electronic Devices at Early Stages of Life Cycle
Author(s) -
V. Stupak
Publication year - 2011
Publication title -
elektronika ir elektrotechnika
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.224
H-Index - 26
eISSN - 2029-5731
pISSN - 1392-1215
DOI - 10.5755/j01.eee.112.6.445
Subject(s) - reliability (semiconductor) , failure rate , reliability engineering , computer science , nonlinear system , stage (stratigraphy) , lithuanian , electronics , engineering , electrical engineering , paleontology , power (physics) , linguistics , physics , philosophy , quantum mechanics , biology
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