Open AccessElectromigration Aware Cell Design
Author(s) -
Gracieli Posser,
Ricardo Reis,
Sachin S. Sapatnekar
Publication year - 2016
Language(s) - Uncategorized
Resource type - Conference proceedings
DOI - 10.5753/ctd.2016.9144
Subject(s) - electromigration , benchmark (surveying) , reliability (semiconductor) , joule heating , nanometre , electronic circuit , circuit reliability , characterization (materials science) , integrated circuit , electronic engineering , materials science , computer science , position (finance) , chip , optoelectronics , electrical engineering , nanotechnology , engineering , power (physics) , physics , telecommunications , geodesy , finance , quantum mechanics , economics , composite material , geography
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