Open AccessImproving Reliability of a Residency Interview Process
Author(s) -
Michael J. Peeters,
Michelle L. Serres,
Todd E. Gundrum
Publication year - 2013
Publication title -
american journal of pharmaceutical education
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.796
H-Index - 63
eISSN - 1553-6467
pISSN - 0002-9459
DOI - 10.5688/ajpe778168
Subject(s) - interview , reliability (semiconductor) , rasch model , phase (matter) , psychology , process (computing) , facet (psychology) , reliability engineering , computer science , applied psychology , social psychology , engineering , chemistry , developmental psychology , power (physics) , physics , organic chemistry , quantum mechanics , political science , law , personality , big five personality traits , operating system
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